Semiconductor device having soi substrate and method for manufacturing the same

ABSTRACT

A semiconductor device includes: a SOI substrate including a support layer, a first insulation film and a SOI layer; a first circuit; a second circuit; and a trench separation element. The SOI substrate further includes a first region and a second region. The first region has the support layer, the first insulation film and the SOI layer, which are stacked in this order, and the second region has only the support layer. The trench separation element penetrates the support layer, the first insulation film and the SOI layer. The trench separation element separates the first region and the second region. The first circuit is disposed in the SOI layer of the first region. The second circuit is disposed in the support layer of the second region.

CROSS REFERENCE TO RELATED APPLICATIONS

This application is based on Japanese Patent Applications No.2007-300364 filed on Nov. 20, 2007, and No. 2008-236452 filed on Sep.16, 2008, the disclosures of which are incorporated herein by reference.

FIELD OF THE INVENTION

The present invention relates to a semiconductor device having a SOIsubstrate and a method for manufacturing a semiconductor device having aSOI substrate.

BACKGROUND OF THE INVENTION

Recently, an in-vehicle equipment or an industrial robot become highlyfunctionally. A system performs to drive an actuator and to operate anair bag device based on an output corresponding to calculation result ofdata such as an image, a sound and an acceleration obtained from signalsof various sensors. A semiconductor device is used for the system, andformed of one chip device. The device includes many kinds of electricelements, which are separated from each other with junction isolationand/or oxide film isolation. The device is defined as a compositedevice, which is disclosed in, for example, JP-A-H08-181211.

An element isolation structure for providing the composite device is thejunction isolation structure or the oxide film isolation structure. Inthe junction isolation structure, a PN junction surrounds an element sothat the element is isolated. In the oxide film isolation structure, anoxide film is formed in a trench, which is formed on a SOI layer of aSOI substrate and reaches an embedded oxide film, so that an element isisolated with the oxide film. The oxide film isolation structure hassurge resistance higher than the junction isolation structure since theoxide film isolation structure has no parasitic element. Further, thedimensions of the oxide film isolation structure are smaller than thoseof the junction isolation structure.

However, since the composite device includes various circuits, it isnecessary to thicken the thickness of the SOI layer. For example, when alogic circuit and a high power circuit are formed in the same substrate,it is necessary to increase the thickness of the SOI layer for securinga breakdown voltage of the high power circuit. Here, the logic circuitincludes a CMOS for performing calculation, and the high power circuitincludes a diode for protecting from ESD (i.e., electro staticdischarge) and a LDMOS for handling high power, i.e., high voltageelectricity. Accordingly, in the logic circuit, a well layer is formedin the thick SOI layer, and an element is formed in the well layer.Thus, a parasitic capacitor is formed at a boundary of the well layer,and the parasitic capacitance is not sufficiently small. The energyconsumption increases, and calculation speed decreases.

Thus, it is required for a composite device to be formed of one chipdevice, and to reduce the thickness of the SOI layer even when thecomposite device includes a signal processor and a high power circuit.

SUMMARY OF THE INVENTION

In view of the above-described problem, it is an object of the presentdisclosure to provide a semiconductor device having a SOI substrate. Itis another object of the present disclosure to provide a method formanufacturing a semiconductor device having a SOI substrate.

According to a first aspect of the present disclosure, a semiconductordevice includes: a SOI substrate including a support layer, a firstinsulation film and a SOI layer; a first circuit; a second circuit; anda trench separation element. The SOI substrate further includes a firstregion and a second region. The first region has the support layer, thefirst insulation film and the SOI layer, which are stacked in thisorder, and the second region has only the support layer. The trenchseparation element penetrates the support layer, the first insulationfilm and the SOI layer. The trench separation element separates thefirst region and the second region. The first circuit is disposed in theSOI layer of the first region. The second circuit is disposed in thesupport layer of the second region.

In the above device, the first and second circuits are mounted in onechip without thickening the SOI layer.

According to a second aspect of the present disclosure, a method formanufacturing a semiconductor device includes: bonding a SOI layer, afirst insulation layer and a support layer to provide a SOI substrate;forming a trench in the SOI substrate to penetrate the SOI layer and thefirst insulation film and to reach the support layer; filling the trenchwith a second insulation film to provide a trench separation element,wherein the trench separation element divides the SOI substrate into afirst region and a second region; forming a first circuit in the SOIlayer of the first region; removing the SOI layer and the firstinsulation film in the second region; and forming a second circuit inthe support layer of the second region.

The above method provides the semiconductor device, in which the firstand second circuits are mounted in one chip without thickening the SOIlayer.

According to a third aspect of the present disclosure, a method formanufacturing a semiconductor device includes: implanting an oxygen ioninto a silicon substrate as a bulk substrate; heating the siliconsubstrate to form an insulation film at a predetermined depth of thesilicon substrate so that a SOI layer, the first insulation film and asilicon support layer provide a partial SOI substrate, wherein thepartial SOI substrate includes a first region and a second region, andthe first region includes the SOI layer, the first insulation film andthe silicon support layer, and the second region includes only thesilicon support layer; forming a trench in the partial SOI substrate topenetrate the SOI layer and the first insulation film and to reach thesilicon support layer, wherein the trench is disposed between the firstregion and the second region; filling the trench with a secondinsulation film to provide a trench separation element, wherein thetrench separation element divides the partial SOI substrate into thefirst region and the second region; forming a first circuit in the SOIlayer of the first region; and forming a second circuit in the supportlayer of the second region.

The above method provides the semiconductor device, in which the firstand second circuits are mounted in one chip without thickening the SOIlayer.

BRIEF DESCRIPTION OF THE DRAWINGS

The above and other objects, features and advantages of the presentinvention will become more apparent from the following detaileddescription made with reference to the accompanying drawings. In thedrawings:

FIG. 1 is a diagram illustrating a cross sectional view of asemiconductor device according to a first embodiment;

FIGS. 2A and 2B are diagrams illustrating a method for manufacturing thesemiconductor device according to the first embodiment;

FIGS. 3A and 3B are diagrams illustrating the method for manufacturingthe semiconductor device;

FIGS. 4A and 4B are diagrams illustrating the method for manufacturingthe semiconductor device;

FIG. 5 is a diagram illustrating a cross sectional view of asemiconductor device according to a second embodiment;

FIG. 6 is a diagram illustrating a cross sectional view of asemiconductor device according to a third embodiment;

FIG. 7 is a diagram illustrating a cross sectional view of asemiconductor device according to a fourth embodiment;

FIG. 8 is a diagram illustrating a cross sectional view of asemiconductor device according to a fifth embodiment;

FIG. 9A is a diagram illustrating a top view of the semiconductor deviceaccording to the fifth embodiment, and FIG. 9B is a diagram illustratinga partially enlarged top view of the device in FIG. 9A;

FIG. 10 is a diagram illustrating a cross sectional view of asemiconductor device according to a sixth embodiment;

FIG. 11 is a diagram illustrating a cross sectional view of asemiconductor device according to a seventh embodiment;

FIG. 12 is a diagram illustrating a cross sectional view of asemiconductor device according to an eighth embodiment;

FIG. 13 is a diagram illustrating a cross sectional view of asemiconductor device according to a ninth embodiment;

FIG. 14 is a diagram illustrating a top view of the semiconductor deviceaccording to the ninth embodiment;

FIG. 15 is a diagram illustrating a cross sectional view of asemiconductor device according to a tenth embodiment;

FIGS. 16A and 16B are diagrams illustrating a method for manufacturingthe semiconductor device according to the tenth embodiment;

FIGS. 17A and 17B are diagrams illustrating the method for manufacturingthe semiconductor device according to the tenth embodiment;

FIG. 18 is a diagram illustrating a cross sectional view of asemiconductor device according to an eleventh embodiment;

FIG. 19 is a diagram illustrating a cross sectional view of asemiconductor device according to a twelfth embodiment;

FIG. 20 is a diagram illustrating a cross sectional view of asemiconductor device according to a thirteenth embodiment; and

FIG. 21 is a diagram illustrating a top view of a semiconductor deviceaccording to a fourteenth embodiment.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS First Embodiment

FIG. 1 shows a semiconductor device according to a first embodiment.Here, an upper side of the drawing of FIG. 1 represents a foreside ofthe device, and a lower side of the drawing of FIG. 1 represents abackside of the device.

The device is formed of a SOI substrate 4 having a SOI layer 1, anembedded oxide film 3 and a support layer 2, which are stacked in thisorder. The SOI layer 1 is made of N conductive type silicon, and theembedded oxide film 3 provides a BOX (i.e., buried oxide) film.

The SOI layer 1 is disposed on the foreside of the device, and formed bygrinding a silicon substrate so that a thickness of the SOI layer 1 isin a range between 10 nm and 10 μm. A signal processing circuit such asa logic circuit driven by small electricity is formed in the SOI layer1. A region, in which the signal processing circuit is formed, isdefined as a low power circuit portion R1.

The low power circuit portion R1 is separated from other portions with atrench separation portion 7 so that an element in the low power circuitportion R1 is separated from other elements in the other portions. Thetrench separation portion 7 provides element separation or elementisolation. The trench separation portion 7 includes a trench 5 and aninsulation film 6 in the trench 5. Various elements for forming thesignal processing circuit such as a CMOS transistor 10 is disposed inthe low power circuit portion R1. Specifically, element isolation isprovided by an insulation film 11 such as a STI (i.e., shallow trenchisolation) film and a LOCOS oxide film. The insulation film 11 dividesthe SOI layer 1 into multiple regions. Each region isolated from eachother includes a N conductive type well layer (i.e., N well layer) 12 aor a P conductive type well layer (i.e., P well layer) 12 b. A P⁺conductive type source region 13 a and a P⁺ conductive type drain region14 a are formed in the N well layer 12 a. An N⁺ conductive type sourceregion 13 b and a N⁺ conductive type drain region 14 b are formed in theP well layer 12 b. A gate electrode 16 a is formed on a part of thesurface of the N well layer 12 a via a gate insulation film 15 a, andthe part of the N well layer 12 a is disposed between the P⁺ sourceregion 13 a and the P⁺ drain region 14 a. Another gate electrode 16 b isformed on a part of the surface of the P well layer 12 b via a gateinsulation film 15 b, and the part of the P well layer 12 b is disposedbetween the N⁺ source region 13 b and the N⁺ drain region 14 b. Thus,the CMOS transistor 10 is provided by a N channel MOSFET and a P channelMOSFET.

The gate electrodes 16 a, 16 b, a wiring (not shown) for connecting tothe source regions 13 a, 13 b and the drain regions 14 a, 14 b, and aninterlayer insulation film (not shown) are formed on a surface portionof the SOI layer 1. A bipolar transistor (not shown), a diffusionresistor (not shown), a memory (not shown) and the like are formed inthe surface portion of the SOI layer 1. Only the CMOS transistor 10 asan example is shown in FIG. 1.

The other portion R2 of the low power circuit portion R1 in the SOIsubstrate 4 does not include the SOI layer 1 and the embedded oxide film3, which are removed from the SOI substrate 4. Thus, the support layer 2is exposed on the foreside of the device. A step is formed between theother portion R2 and the low power circuit portion R1. The step is equalto thickness of the SOI layer 1 and the embedded oxide film 3. The otherportion R2, in which the support layer 2 is exposed on the foreside ofthe device, is defined as a high power circuit portion R2. Various highpower elements are formed in the high power circuit portion R2.

The high power circuit portion R2 is also isolated with the trenchseparation portion 7 including the trench 5 and the insulation film 6.The high power circuit portion R2 is separated into multiple regions. InFIG. 1, the high power circuit portion R2 is separated into two regionswith the trench separation portion 7, and a power MOSFET transistor 20is formed in a first region, and a protection diode 30 is formed in asecond region. The power MOSFET transistor 20 has a trench gatestructure.

The power MOSFET transistor 20 is a vertical type high power element sothat current flows from the foreside of the support layer 2 to thebackside of the support layer 2. A P conductive type base region 21 isformed in the surface portion of the support layer 2 in the first regionof the high power circuit portion R2. A N⁺ conductive type source region22 is formed in the base region 21 such that the source region 22 isterminated in the base region 21. A trench 23 is formed to penetrate thesource region 22 and the base region 21 and to reach the support layer2. A gate insulation film 24 is formed on an inner wall of the trench23, and a gate electrode 25 is embedded in the trench 23 via the gateinsulation film 24. Thus, the gate electrode 25 is disposed on a surfaceof the gate insulation film 24. A N⁺ conductive type drain region 26 isformed on the backside of the support layer 2. Further, a drainelectrode 27 is formed to electrically connect to the drain region 26.The connection between the drain electrode 27 and the drain region 26 isohmic contact. Thus, the power MOSFET transistor is formed.

The gate electrode 25, a wiring (not shown) for connecting to the N⁺conductive type source region 22 and the base region 21, and aninterlayer insulation film (not shown) are formed on the foreside of thesupport layer 2.

A P conductive type anode layer 31 and a N conductive type cathode layer32 are formed in a surface portion of the support layer in the secondregion of the high power circuit portion R2. The protection diode 30 isdisposed in the second region. The N conductive type cathode layer 32 isdisposed in the P conductive type anode layer 31 such that the cathodelayer 32 is terminated in the anode layer 31. The anode layer 31 and thecathode layer 32 provide a PN junction of the protection diode 30. Thediode 30 is a lateral type element so that current flows in a directionin parallel to the surface of the device. An insulation film 33 covers apart of the backside of the support layer 2 in the second region of thehigh power circuit portion R2.

The cathode layer 32, the anode layer 31, a wiring (not shown) forconnecting to the cathode layer 32 and the anode layer 31, and aninterlayer insulation film (not shown) are formed in the surface portionof the protection diode 30.

The above device includes the SOI substrate 4, which has the low powercircuit portion R1 in the SOI layer 1 and the high power circuit portionR2 in the support layer 2.

Accordingly, the thickness of the SOI layer 1 is determined in view offormation of the low power circuit portion R1 without consideringphysical properties of the high power circuit portion R2 such as breakdown voltage. In the device, the well layer 12 a, 12 b have no boundaryin the SOI layer 1, compared with a case where a well layer is formed ina thick SOI layer. Accordingly, a parasitic capacitor is not formedbetween the well layer 12 a, 12 b and the SOI layer 1. Further, thedevice prevents from increasing energy consumption caused by theparasitic capacitor, and from decreasing calculation speed.

Since the high power circuit portion R2 is formed in the support layer2, which has sufficient thickness, breakdown voltage and the like ofelements in the high power circuit portion R2 are sufficiently large.

Thus, the low power circuit portion R1 including the signal processingcircuit and the high power circuit portion R2 including the power MOSFETtransistor 20 are integrated into one chip. Further, the thickness ofthe SOI layer 1 is limited.

The manufacturing method of the semiconductor device will be explainedwith reference to FIGS. 2A to 4B.

In FIG. 2A, the SOI substrate 4 is prepared. The SOI layer 1 made of Nconductive type silicon, the embedded oxide film 3 and the support layer2 are stacked and bonded in this order so that the SOI substrate 4 isprepared. A method for forming the substrate 4 is well know.

In FIG. 2B, the trench 5 is formed in the SOI substrate 4. For example,a mask made of a photo resist, a silicon oxide film or a silicon nitridefilm is formed on the surface of the SOI layer 1. Then, a part of theSOI layer 1 is opened, the part to be the trench 5. The SOI layer 1, theembedded oxide film 3 and the support layer 3 are etched with using themask such that the opening reaches the support layer 3. Specifically,the trench 5 reaches a middle of the support layer 3 so that the trench5 does not penetrate the support layer 3. In this case, it is necessaryto switch etchant between a step for etching the SOI layer 1 and thesupport layer 2 made of silicon and a step for etching the embeddedoxide film 3 made of an insulation film such as a silicon oxide film.Then, the device is heated and oxidized so that the thermal oxide filmis formed on the inner wall of the trench 5. A poly silicon film isformed on the surface of the thermal oxide film so that the oxide filmis embedded in the trench 5. After that, the poly silicon film and themask formed on the foreside of the SOI layer 1 are removed by a CMPgrinding method. Thus, the trench separation portion 7 having theinsulation film 6 in the trench 5 is formed.

In FIG. 3A, the signal processing circuit including the CMOS transistor10 is formed in a predetermined part of the SOI layer 1 by aconventional method including, for example, an element isolation stepperformed by a STI method, a forming step of the N conductive type welllayer 12 a and the P conductive type well layer 12 b performed by an ionimplantation method and an activation thermal method, a forming step ofthe source regions 13 a, 13 b and the drain regions 14 a, 14 b performedby an ion implantation method and an activation thermal method, aforming step of the gate insulation film 15 performed by a thermaloxidation method, and a forming step of the gate electrodes 16 a, 16 bincluding a deposition process of a doped poly silicon film and apatterning process. Thus, the low power circuit portion R1 is formed.

After a mask is formed to cover the low power circuit portion R1, a partof the SOI layer 1 and the embedded oxide film 3 is removed by etchingso that the high power circuit portion R2 is prepared. The support layer2 in the high power circuit portion R2 is exposed to the foreside of thedevice.

In FIG. 3B, a trench gate structure of the power MOSFET transistor and aPN junction of the protection diode 30 are formed in a surface portionof the support layer 2 in the high power circuit portion R2 by aconventional method including, for example, a forming step of the Pconductive type base region 21, the N⁺ conductive type source region 22,the P conductive type anode layer 31 and the N conductive type cathodelayer 32 performed by an ion implantation method and an activationthermal method, a forming step of the trench 23, a forming step of thegate insulation film 24 including a thermal oxidation process and astacking process of a silicon nitride film, and a forming step of thegate electrode 25 including an embedding process of a doped poly siliconfilm and an etch back process.

In FIG. 4A, the backside of the support layer 2 turns up, and thebackside of the support layer 2 is ground by a CMP grinding method sothat the trench separation portion 7 is exposed on the backside of thesupport layer 2. Then, a N conductive type impurity is implanted on thebackside of the support layer 2. After that, the device is thermallyactivated in a thermal activation process so that the N⁺ conductive typedrain region 26 is formed. Thus, the insulation film 33 is deposited onthe backside of the support layer 2, and patterned to remain only thebackside of the protection diode 30.

In FIG. 4B, an electrode layer made of aluminum or the like is depositedon the backside of the support layer 2, and patterned so that the drainelectrode 27 is formed on the backside of the power MOSFET transistor20.

Then, a forming step of the interlayer insulation film, a forming stepof the wiring, and a forming step of a protection film are executed, sothat the semiconductor device is completed.

The semiconductor device includes the SOI substrate 4, the low powercircuit portion R1 is formed in the SOI layer 1, and the high powercircuit portion R2 is formed in the support layer 1. Thus, the low powercircuit portion R1 and the high power circuit portion R2 are integratedinto one chip, and the thickness of the SOI layer 1 is comparativelysmall.

Second Embodiment

In a second embodiment, the device includes multiple power MOSFETtransistors 20 and multiple protection diodes 30, which are separatedand isolated from each other.

FIG. 5 shows the device according to the second embodiment. Each powerMOSFET transistor 20 is disposed in a corresponding cell. The cells areseparated with the trench separation portion 7. Specifically, each cellincludes multiple N⁺ conductive type drain regions 26 and multiple drainelectrodes 27. Further, each protection diode 30 is disposed in acorresponding cell, and the cells are separated from each other.

Thus, multiple power MOSFET transistors 20 and multiple protectiondiodes 30 are separated and isolated from each other. The power MOSFETtransistor 20 includes multiple drain electrodes 27, so that the powerMOSFET transistor 20 provides a multi-channel device.

The above device is manufactured by using a mask having a differentpattern in the step of forming the trench separation portion 7, using amask having a different pattern in the step of forming the N⁺ conductivetype drain region 26 and the drain electrode 27.

Third Embodiment

In a third embodiment, a threshold value of the CMOS transistor 10 inthe low power circuit portion R1 is adjusted.

FIG. 6 shows a semiconductor device according to the third embodiment. Athreshold control electrode 40 is formed on the backside of the supportlayer 2 in the low power circuit portion R1 such that the thresholdcontrol electrode 40 correspond to and is opposite to the CMOStransistor 10. FIG. 6 shows a case where multiple CMOS transistors 10are formed in the low power circuit portion R1. The CMOS transistors 10are separated from each other with the trench separation portion 7.Further, each CMOS transistor 10 has the threshold control electrode 40.Here, in FIG. 6, two CMOS transistors 10 disposed on the left side ofthe drawing are not shown.

The threshold control electrode 40 controls an electric potential to beapplied to the support layer 2, which corresponds to the opposite sideof the CMOS transistor 10. Thus, the operation threshold of the CMOStransistor 10 is controlled. When the operation threshold of the CMOStransistor 10 is set to be low, the CMOS transistor 10 functions withhigh speed. The specific values of the CMOS transistor 10 are adjustedto be predetermined values.

A step for forming the threshold control electrode 40 may be performedtogether with the step for forming the drain electrode 27. Thus, thedevice shown in FIG. 6 is manufactured without adding a step for thethreshold control electrode 40 in the manufacturing steps shown in FIGS.2A to 4B.

Fourth Embodiment

In a semiconductor device according to a fourth embodiment, thethreshold of the CMOS transistor 10 in the low power circuit portion R1is controlled.

FIG. 7 shows the device according to the fourth embodiment. MultipleCMOS transistors 10 are formed in the low power circuit portion R1. TheCMOS transistors 10 are separated from each other with the trenchseparation portion 7. The SOI layer 1 and the embedded oxide film 3 arepartially removed around each CMOS transistor 10. The threshold controlelectrode 40 is formed on the support layer 2 at a place where the SOIlayer 1 and the embedded oxide film 3 are removed. The threshold controlelectrode 40 is electrically connected to the support layer 2. Aninsulation film 41 is formed between the CMOS transistor 10 and thethreshold control electrode 40 so that the CMOS transistor 10 isisolated from the threshold control electrode 40. Here, in FIG. 7, twoCMOS transistors 10 disposed on the left side of the drawing are notshown.

In the low power circuit portion R1, the support layer 2 includes anupper layer 2 a and a lower layer 2 b. The upper layer 2 a is a Pconductive type layer 2 a, and the lower layer 2 b is a N conductivetype layer 2 b so that the upper and lower layers 2 a, 2 b provide a PNjunction. Further, the backside of the support layer 2 in the low powercircuit portion R1 is covered with an insulation film 33.

The threshold control electrode 40 disposed on the foreside of thedevice is electrically connected to the support layer 2 so that theoperation threshold of the CMOS transistor 10 is controlled.

Thus, the device has the effect described in the third embodiment.Further, since the PN junction is formed in the support layer 2, voltagetransfer through the support layer 2 is limited.

The device shown in FIG. 7 is formed such that a step for forming thethreshold control electrode 40 and a step for forming the P conductivetype layer 2 a or the N conductive type layer 2 b are added in the stepsshown in FIGS. 1A to 4B. Specifically, when a part of the SOI layer 1and the embedded oxide film 3 are removed so that the trench separationportion 7 is formed, another part of the SOI layer 1 and the embeddedoxide film 3 are also removed. The other part of the SOI layer 1 and theembedded oxide film 3 correspond to the threshold control electrode 40.Then, a part of the support layer 2 disposed under the threshold controlelectrode 40 is covered with a mask so that the part of the supportlayer 2 is not removed. When a wiring layer for connecting to the gateelectrode 16 a, 16 b, the source region 13 a, 13 b or the drain region14 a, 14 b is formed, the threshold control electrode 40 is also formedat the same time. In a step of forming the P conductive type layer 2 aor the N conductive type layer 2 b, when the support layer 2 is made ofa N conductive type material, an ion is preliminarily implanted on thesupport layer 2 before the support layer 2 is bonded to the SOI layer 1via the embedded oxide film 3. Thus, the P conductive type layer 2 a isformed. When the support layer 2 is made of a P conductive typematerial, the N conductive type layer 2 b is formed at the same time ofthe step for forming the N⁺ conductive type drain region 26.

Fifth Embodiment

A semiconductor device according to a fifth embodiment includes a thinfilm structure such as a sensor.

FIG. 8 shows the device according to the fifth embodiment. FIG. 9A showsa top view of the device, and FIG. 9B shows a part of the device. FIG. 8is a cross sectional view of the device taken along line VIII-VIII inFIG. 9A.

In FIG. 8, a thin film structure 50 is disposed between the low powercircuit portion R1 and the high power circuit portion R2. The thin filmstructure 50 is formed by removing the support layer 2 so that the thinfilm structure 50 is formed of the SOI layer 1 and the embedded oxidefilm 3. The thin film structure 50 is, for example, a sensor or amicrophone. Specifically, the thin film structure 50 includes aconcavity 51, which is formed by hollowing the surface of the SOI layer1. Thus, The SOI layer 1 is thinned so that the concavity 51 provides adiaphragm 51, which is formed on the SOI layer 1 and the embedded oxidefilm 3. A piezo resistor 53 made of, for example, a p conductive typediffusion layer is formed on the diaphragm 52. When the diaphragm 52becomes distorted by application of pressure or sound, the resistance ofthe piezo resistor 53 is changed in accordance with the distortion ofthe diaphragm 52. The thin film structure 50 provides a sensor fordetecting pressure or a microphone for detecting sound based on theresistance change of the resistor 53.

In FIG. 9B, the device includes four piezo resistors 53. Each piezoresistor 53 is electrically connected to the signal processing circuitin the low power circuit portion R1 via a wiring 54. The resistancechange of each piezo resistor 53 is transmitted to the signal processingcircuit through the wiring 54 so that the thin film structure 50functions as a sensor or a microphone.

The thin film structure 50 is disposed at a center of a chip of thedevice. Accordingly, the thin film structure 50 is surrounded with thesupport layer 2 so that the thin film structure 50 is prevented frombeing damaged. Specifically, in FIG. 9A, an upper side of the thin filmstructure 50 includes the support layer 2, and a lower side of the thinfilm structure 50 includes the support layer 2, so that the supportlayer 2 in the upper and lower sides is not removed.

The thin film structure 50 includes the embedded oxide film 3.Alternatively, the thin film structure 50 may have no embedded oxidefilm 3. Alternatively, the thickness of the embedded oxide film 3 in thethin film structure 50 may be thinned, so that sensor sensitivityincreases.

Sixth Embodiment

In a semiconductor device according to a sixth embodiment, the powerMOSFET transistor 20 is completely isolated from other parts of thedevice.

FIG. 10 shows the device. The device includes multiple trench separationportions 7, which are formed between the power MOSFET transistor 20 andother parts of the device. Specifically, the trench separation portions7 are disposed between the power MOSFET transistor 20 and the low powercircuit portion R1. Further, the trench separation portions 7 aredisposed between the power MOSFET transistor 20 and the protection diode30. Thus, the device has multi-trench structure.

The power MOSFET transistor 20 is isolated and separated from otherelements in the device with the multi trench structure having multipletrench separation portions 7. Thus, the power MOSFET transistor 20 issecurely isolated from the other elements. The high voltage applied tothe power MOSFET transistor 20 is not affected to the other elements,and thereby, electric potential interference between the power MOSFETtransistor 20 and the other elements is reduced.

Seventh Embodiment

In a semiconductor device according to a seventh embodiment, the powerMOSFET transistor 20 is divided into a main cell and a sensing cell.

FIG. 11 shows the device. The power MOSFET transistor 20 is divided tothe main and sensing cells with the trench separation portion 7. Themain cell includes multiple elements, and the sensing cell includes anelement, which has the same structure as the element in the main cell.Alternatively, the sensing cell may include multiple elements, and thenumber of elements in the sensing cell is smaller than that in the maincell. A current in proportion to the large current flowing through themain cell flows through the sensing cell, so that the sensing celldetects the current. Thus, the large current flowing through the maincell is detected. The device may be used for a load driving device forsupplying the large current flowing through the main cell to a load.

Even when the power MOSFET transistor 20 is divided into the main celland the sensing cell, the effect of the device according to the seventhembodiment is the same as the first embodiment. Although the device hasno protection diode 30, the device may include the protection diode 30.

Eighth Embodiment

A semiconductor device according to an eighth embodiment includes atemperature sensor.

FIG. 12 shows the device according to the eighth embodiment. Atemperature sensor 60 is formed in the high power circuit portion R2 tobe adjacent to the power MOSFET transistor 20. The temperature sensor 60includes multiple PN diodes having a P conductive type layer 61 and a Nconductive type layer 62. The temperature sensor 60 detects thetemperature of the power MOSFET transistor 20 based on the temperatureproperty of the PN diode. Based on the temperature detected by thetemperature sensor 60, the power MOSFET transistor 20 is controlled toprotect from excess temperature increase. Specifically, the operationstate of the power MOSFET transistor 20 is controlled based on variouscalculation in the signal processing circuit in the low power circuitportion R1.

The temperature sensor 60 does not consume the large current. Therefore,the temperature sensor 60 may be disposed in the low power circuitportion R1. When the temperature sensor 60 is disposed in the high powercircuit portion R2, the temperature sensor 60 can detect the temperatureof the power MOSFET transistor 20 with high accuracy since thetemperature sensor 60 is disposed near the power MOSFET transistor 20.

Even when the device includes the temperature sensor 60 for detectingthe temperature of the power MOSFET transistor 20, the device accordingto the eighth embodiment has the same effect as the first embodiment.

Ninth Embodiment

A semiconductor device according to a ninth embodiment includes thetemperature sensor 60, which is arranged at a place different from thedevice shown in FIG. 12.

FIG. 13 shows the device according to the ninth embodiment. FIG. 14 is atop view of the device. The temperature sensor 60 is disposed on thesurface of the support layer 2, in which the power MOSFET transistor 20is formed. The temperature sensor 60 is formed on the surface of thesupport layer 2 in the high power circuit portion R2 via an insulationfilm 63 such as an oxide film

Even when the temperature sensor 60 is formed on the surface of thesupport layer 2, the device according to the ninth embodiment has thesame effect as the eighth embodiment. Further, since the temperaturesensor 60 is closer to the power MOSFET transistor 20 than that in FIG.12, the temperature sensor 60 can detect the temperature of the powerMOSFET transistor 20 much accurately.

Tenth Embodiment

A semiconductor device according to a tenth embodiment has a partial SOIstructure. The device is not formed from a SOI substrate, a whole ofwhich has the SOI structure.

FIG. 15 shows the device according to the tenth embodiment. In the firstembodiment, the device has the SOI substrate 4 having the SOI structureon the whole of the substrate 4, the SOI structure including the supportlayer 2, the embedded oxide film 3 and the SOI layer 1 stacked in thisorder. In FIG. 15, the substrate 4 has the SOI structure only in the lowpower circuit portion R1. Accordingly, there is no step between the lowpower circuit portion R1 and the high power circuit portion R2, so thatthe surface of the low portion circuit portion R1 is disposed on thesame plane as the surface of the high power circuit portion R2. Thus,the SOI substrate 4 is a partial SOI substrate having the SOI structurepartially.

FIGS. 16A to 17B show a method for manufacturing the device according tothe tenth embodiment.

In FIG. 16A, a silicon substrate 8 as a bulk substrate is prepared. Thetrench separation portion 7 is formed on the surface of the siliconsubstrate 8. The process for manufacturing the trench separation portion7 in FIG. 16A is similar to that in FIG. 2B. In FIG. 16B, a region otherthan the low power circuit portion R1 is covered with a mask (notshown). Then, an ion such as an oxygen ion is implanted on the substrate8 with the mask. For example, the dose amount of the ions is in a rangebetween 1×10¹⁷ cm⁻³ and 10×10¹⁷ cm⁻³. The implantation energy is in arange between 50 eV and 500 eV. Thus, the oxygen ions are implanted at apredetermined depth from the surface of the silicon substrate 8.

In FIG. 17A, a thermal process is performed. For example, the device isheated at a temperature in a range between 1200° C. and 1400° C. forabout five hours. This thermal process provides oxidation reactionbetween the oxygen ions implanted in the low power circuit portion R1and silicon in the silicon substrate 8 so that the embedded oxide film 3is formed. The embedded oxide film 3 separates the silicon substrate 8into two parts. The upper part of the substrate 8 provides the SOI layer1, and the lower part of the substrate 8 provides the support layer 2.Further, the silicon substrate 8 in the high power circuit portion R1provides the support layer 2.

Then, the steps shown in FIGS. 3A to 4B are executed so that the deviceshown in FIG. 17 b is completed. As shown in FIGS. 16A and 16B, theembedded insulation film 3 is formed after the trench separation portion7 is formed. Alternatively, the trench separation portion 7 may beformed after the embedded insulation film 3 is formed.

Eleventh Embodiment

A semiconductor device according to an eleventh embodiment includesmultiple embedded oxide films 3.

FIG. 18 shows the device according to the eleventh embodiment. The SOIsubstrate 4 includes two embedded oxide films 3. The total thickness ofthe oxide films 3 in FIG. 18 may be equal to the thickness of theembedded oxide film 3 shown in FIG. 15. In this case, the breakdownvoltage of the device in FIG. 18 is substantially the same as that inFIG. 15. Alternatively, the total thickness of the oxide films in FIG.18 may be different from that in FIG. 15.

The manufacturing method for multiple embedded oxide films 3 is suchthat the implantation energy of the oxygen ions in FIG. 16B is changedso that the implantation depth is controlled.

Twelfth Embodiment

A semiconductor device according to a twelfth embodiment has a powerMOSFET transistor 20, which is different from that in FIG. 1.

FIG. 19 shows the device according to the twelfth embodiment. Thesupport layer 2 has a super junction structure in the high power circuitportion R2, in which the power MOSFET transistor 20 is formed.Specifically, multiple N⁺ conductive type layers 28 a and multiple Pconductive type layers 28 b are alternately arranged. The N⁺ conductivetype layer 28 a faces the trench gate structure in the MOSFET transistor20, so that the N⁺ conductive type layer 28 a is disposed under the N⁺conductive type source region 22. The P conductive type layer 28 b isdisposed between two trench gate structures. When the device includesthe super junction structure, the breakdown voltage of the power MOSFETtransistor 20 is improved. Specifically, when the power MOSFETtransistor 20 is not operated, a depletion layer extending along withthe PN junction between the N⁺ conductive type layer 28 a and the Pconductive type layer 28 b pinches off a current path, and thereby, thebreakdown voltage is increased. Further, when the power MOSFETtransistor 20 is operated, the depletion layer is reduced so that thecurrent flows through the N⁺ conductive type layer 28 a, which has highimpurity concentration. Thus, the device has low on-state resistance.

Thirteenth Embodiment

A semiconductor device according to a thirteenth embodiment includesvarious elements in each of the low and high power circuit portions R1,R2. The elements are coupled with a wiring.

FIG. 20 shows the device having the main cell and the sensing cell inthe power MOSFET transistor 20. Further, the device includes thetemperature sensor 60. FIG. 20 shows a wiring structure of the device.In the device, the temperature sensor 60 is formed in the low powercircuit portion R1.

Each element isolated with the trench separation portion 7 iselectrically coupled with the signal processing circuit in the low powercircuit portion R1 via a pair of a wiring layer 70 and an interlayerinsulation film 71. The wiring layer 70 is made of conductive materialsuch as metal. Specifically, the wiring layer 70 is made of, forexample, aluminum. The interlayer insulation film 71 is formed on thewiring layer 70. In FIG. 20, a wiring for a pair of the temperaturesensor 60 and the signal processing circuit, which are coupled with eachother, another wiring for a pair of the sensing cell in the power MOSFETtransistor 20 and the signal processing circuit, which are coupled witheach other, and further another wiring for a pair of the main cell inthe power MOSFET transistor 20 and the signal processing circuit, whichare coupled with each other, are provided by a three-layer structure.The wiring for the main cell, which is disposed on an upper side of thedevice, is provided by the wiring layer 70. The wiring layer 70 isformed on a whole area of the main cell, on which the power MOSFETtransistor 20 is formed. The wiring layer 70 also functions as a sourceelectrode for electrically coupling with the N⁺ conductive type sourceregion 22. A protection film 73 is formed on the wiring layer 70. Theprotection film 73 has an opening, through which the wiring layer 70 isexposed. The wiring layer 70 exposed from the opening of the protectionfilm 73 provides a pad for electrically coupling with an externalcircuit. The pad is connected to the external circuit by a bondingmethod or the like.

Even when various elements are disposed in each of the low and highpower circuit portions R1, R2, each element is surely connected to thesignal processing circuit.

Fourteenth Embodiment

A semiconductor device according to a fourteenth embodiment includesvarious elements in each of the low and high power circuit portions R1,R2. The device has the wiring structure for coupling the elements with awiring.

In FIG. 20, the device includes the three-layer structure, in whichmultiple wiring layers 70 and multiple interlayer insulation film 71 arestacked. However, in this embodiment, the wiring structure in the deviceincludes only one wiring for coupling the elements and the signalprocessing circuit.

FIG. 21 shows the device according to the fourteenth embodiment. In thedevice, the power MOSFET transistor 20 is divided into the main cell andthe sensing cell. Further, the device includes the thin film structure50 and the temperature sensor 60. FIG. 21 shows a wiring structure inthe device.

The low power circuit portion R1 includes a first low power region R1 a,in which the signal processing circuit is disposed. The portion R1further includes a second low power region R1 b, in which thetemperature sensor 60 is formed. The second low power region R1 b isadjacent to the first low power region R1 a. The high power circuitportion R2 includes a first high power region R2 a, in which the sensingcell of the power MOSFET transistor 20 is formed. The first high powerregion R2 a is adjacent to the first low power region R1 a. The portionR2 further includes a second high power region R2 b, in which the maincell is formed. The portion R1 further includes a third low power regionR1 c, in which the thin film structure 50 is formed. The third low powerregion R1 c and the first low power region R1 a sandwich the second lowpower region R1 b and the first high power region R2 a. The third lowpower region R1 c is opposite to the first low power region R1 a.

Multiple wiring layers 70 extend from the first low power region R1 a tothe second low power region R1 b, the third low power region R1 c, thefirst high power region R2 a and the second high power region R2 b,respectively. The wiring layers 70 are not overlapped with each other.Thus, only one pair of the wiring layer 70 and the interlayer insulationfilm 71, which is disposed on the wiring layer 70, provide electricconnection between the elements and the signal processing circuit.

Here, an area of the second high power region R2 b in FIG. 21 surroundedwith a dotted line provides a source electrode, which is a part of thewiring layer 70. The protection film 72 has the opening, which isdisposed at the center of the area, so that the wiring layer 70 iscapable of connecting to the external circuit through the opening. Theother area of the second high power region R2 b, which is not surroundedwith the dotted line, provides the wiring layer 70 connecting to thegate electrode 25.

Other Embodiments

The signal processing circuit in the low power circuit portion R1 isprovided by a CMOS transistor. Alternatively, the signal processingcircuit may be provided by a bipolar transistor or the like. The elementin the high power circuit portion R2 is provided by a trench gateMOSFET. Alternatively, the element in the high power circuit portion R2may be another device such as a vertical type device and a lateral typedevice. When the element in the high power circuit portion R2 is a powerdevice, the effect of the device is preferable.

In the first embodiment, the element in the low power circuit portion R1is formed before the SOI layer 1 and the embedded oxide film 3 in thehigh power circuit portion R2 are removed, as shown in FIG. 3A.Alternatively, the element in the low power circuit portion R1 may beformed after the SOI layer 1 and the embedded oxide film 3 in the highpower circuit portion R2 are removed.

In the first embodiment, the backside of the support layer 2 is groundafter the steps shown in FIGS. 3A and 3B. Alternatively, the backside ofthe support layer 2 may be ground before the steps shown in FIGS. 3A and3B.

The above embodiments may be combined with each other. For example, bycombining the second, third and fourth embodiments, the device mayinclude multiple power MOSFET transistors 20 so that the device providesa multi-channel device, and the device may further include the thresholdcontrol electrode 40 for the CMOS transistor 10. Alternatively, bycombining the fifth embodiment and the second to fourth embodiments, thedevice may include the thin film structure 50. Further, by combining thesixth embodiment and the first to fifth embodiments, the device mayinclude the element separation structure having multiple trenches.

The material of each of the SOI substrate 4 and the elements in thesubstrate 4 may be different from the above embodiments. For example,the embedded insulation film of the SOI substrate 4 is the embeddedoxide film 3. Alternatively, the embedded insulation film of the SOIsubstrate 4 may be another insulation film.

The elements in the high power circuit portion R2 are formed on theforeside of the support layer 2. Alternatively, the elements may beformed on the backside of the support layer 2. Further, the elements inthe low power circuit portion R1 also may be formed on the backside ofthe support layer 2.

The low power circuit portion R1 as the first region and the high powercircuit portion R2 as the second region are formed in the device.Alternatively, both the low power circuit portions R1 or both the highpower circuit portions R2 may be formed in the device. It is preferablethat the low power circuit portion R1 is formed in the SOI layer 1, andthe high power circuit portion R2 is formed in the support layer 2.

In the tenth and eleventh embodiments, the SOI substrate 4 is providedby a partial SOI substrate. Alternatively, the substrate in the secondto ninth embodiments may be a partial SOI substrate having a partial SOIstructure, at which the low power circuit portion R1 is formed, and thehigh power circuit portion R2 is formed in the support layer 2.

The above disclosure has the following aspects.

According to a first aspect of the present disclosure, a semiconductordevice includes: a SOI substrate including a support layer, a firstinsulation film and a SOI layer; a first circuit; a second circuit; anda trench separation element. The SOI substrate further includes a firstregion and a second region. The first region has the support layer, thefirst insulation film and the SOI layer, which are stacked in thisorder, and the second region has only the support layer. The trenchseparation element penetrates the support layer, the first insulationfilm and the SOI layer. The trench separation element separates thefirst region and the second region. The first circuit is disposed in theSOI layer of the first region. The second circuit is disposed in thesupport layer of the second region.

In the above device, the first and second circuits are mounted in onechip without thickening the SOI layer.

Alternatively, the SOI substrate may further include a step between thefirst region and the second region, and a height of the step correspondsto a total thickness of the SOI layer and the first insulation film.

Alternatively, the SOI substrate may be a partial SOI substrate suchthat the SOI layer and the first insulation film are partially disposedin the first region. In this case, no step is formed between the firstand second regions. Further, the first insulation film may include aplurality of insulation layers.

Alternatively, the first circuit may include a signal processingcircuit, and the second circuit may include a high power circuit, whichhandles electric power higher than electric power of the signalprocessing circuit. Further, the high power circuit may include a powerdevice. Further, the high power circuit may include a plurality of powerdevices. The trench separation element includes a plurality ofseparation members, which is disposed in the second region. Eachseparation member penetrates the support layer. The second region isdivided into a plurality of second portions by the plurality ofseparation members, and each power device is disposed in a correspondingsecond portion so that the high power circuit provides a multi-channelcircuit. Further, the trench separation element may include a pluralityof trenches so that the trench separation element provides multi-trenchseparation. Further, the power device may be a vertical type powerdevice for flowing current from a first side to a second side of thesupport layer. The first side of the support layer is opposite to thesecond side of the support layer. The second region includes a main celland a sensing cell. The trench separation element is further disposed inthe second region in such a manner that the trench separation elementpenetrates the support layer. The main cell is separated from thesensing cell with the trench separation element, and the sensing cellflows current, which is in proportion to current flowing through themain cell.

Furthermore, the semiconductor device may further include a temperaturesensor for detecting temperature of the power device. The temperaturesensor is disposed in the support layer of the second region, and thetemperature sensor is separated from the power device with the trenchseparation element.

Furthermore, the semiconductor device may further include a temperaturesensor for detecting temperature of the power device. The temperaturesensor is disposed on the support layer in the second region through asecond insulation film, and the temperature sensor is adjacent to thepower device.

Alternatively, the semiconductor device may further include a thresholdcontrol electrode. The first circuit includes a CMOS transistor. Thethreshold control electrode is disposed on the support layer of thefirst region. The threshold control electrode is electrically coupledwith the support layer, and the threshold control electrode controls athreshold of the CMOS transistor.

Alternatively, the semiconductor device may further include a thresholdcontrol electrode. The first circuit includes a CMOS transistor. Thethreshold control electrode is disposed in the first region. Thethreshold control electrode penetrates the SOI layer and the firstinsulation film, and reaches the support layer. The threshold controlelectrode is electrically coupled with the support layer. The thresholdcontrol electrode controls a threshold of the CMOS transistor, and theCMOS transistor is isolated from the threshold control electrode with athird insulation film, which is disposed in the SOI layer. Further, thesupport layer in the first region may further include a P conductivetype layer and a N conductive type layer. The P conductive type layerand the N conductive type layer provide a PN junction, and the thresholdcontrol electrode is electrically coupled with the P conductive typelayer in the support layer.

Alternatively, the semiconductor device may further include a pluralityof threshold control electrodes. The trench separation element includesa plurality of separation members, which is disposed in the firstregion. Each separation member penetrates the support layer, the firstinsulation film and the SOI layer. The first region is divided into aplurality of first portions by the plurality of separation members. Thefirst circuit includes a plurality of CMOS transistors, each of which isdisposed in the SOI layer of a corresponding first portion. Eachthreshold control electrode is disposed on the support layer of acorresponding first portion. Each threshold control electrode iselectrically coupled with the support layer, and each threshold controlelectrode controls a threshold of a corresponding CMOS transistor.

Alternatively, the semiconductor device may further include a thin filmelement disposed between the first region and the second region. Thethin film element is provided by the SOI layer and the first insulationfilm. Further, the thin film element may include a concavity and adiaphragm. The concavity is disposed in the SOI layer so that the SOIlayer is partially thinned. The diaphragm is provided by a thinned SOIlayer and the first insulation film, and the thin film element is one ofa sensor and a microphone.

According to a second aspect of the present disclosure, a method formanufacturing a semiconductor device includes: bonding a SOI layer, afirst insulation layer and a support layer to provide a SOI substrate;forming a trench in the SOI substrate to penetrate the SOI layer and thefirst insulation film and to reach the support layer; filling the trenchwith a second insulation film to provide a trench separation element,wherein the trench separation element divides the SOI substrate into afirst region and a second region; forming a first circuit in the SOIlayer of the first region; removing the SOI layer and the firstinsulation film in the second region; and forming a second circuit inthe support layer of the second region.

The above method provides the semiconductor device, in which the firstand second circuits are mounted in one chip without thickening the SOIlayer.

According to a second aspect of the present disclosure, a method formanufacturing a semiconductor device includes: implanting an oxygen ioninto a silicon substrate as a bulk substrate; heating the siliconsubstrate to form an insulation film at a predetermined depth of thesilicon substrate so that a SOI layer, the first insulation film and asilicon support layer provide a partial SOI substrate, wherein thepartial SOI substrate includes a first region and a second region, andthe first region includes the SOI layer, the first insulation film andthe silicon support layer, and the second region includes only thesilicon support layer; forming a trench in the partial SOI substrate topenetrate the SOI layer and the first insulation film and to reach thesilicon support layer, wherein the trench is disposed between the firstregion and the second region; filling the trench with a secondinsulation film to provide a trench separation element, wherein thetrench separation element divides the partial SOI substrate into thefirst region and the second region; forming a first circuit in the SOIlayer of the first region; and forming a second circuit in the supportlayer of the second region.

The above method provides the semiconductor device, in which the firstand second circuits are mounted in one chip without thickening the SOIlayer.

Alternatively, the implanting the oxygen ion may include: implanting theoxygen ion with a first implantation energy so that the oxygen ion isimplanted at a first depth of the silicon substrate; and implanting theoxygen ion with a second implantation energy so that the oxygen ion isimplanted at a second depth of the silicon substrate. The firstimplantation energy is different from the second implantation energy sothat the first depth is different from the second depth, and the heatingthe silicon substrate provides to form a first insulation layer at thefirst depth of the silicon substrate and a second insulation layer atthe second depth of the silicon substrate so that the first insulationlayer and the second insulation layer provide the insulation film.

While the invention has been described with reference to preferredembodiments thereof, it is to be understood that the invention is notlimited to the preferred embodiments and constructions. The invention isintended to cover various modification and equivalent arrangements. Inaddition, while the various combinations and configurations, which arepreferred, other combinations and configurations, including more, lessor only a single element, are also within the spirit and scope of theinvention.

1. A semiconductor device comprising: a SOI substrate including asupport layer, a first insulation film and a SOI layer; a first circuit;a second circuit; and a trench separation element, wherein the SOIsubstrate further includes a first region and a second region, whereinthe first region has the support layer, the first insulation film andthe SOI layer, which are stacked in this order, and the second regionhas only the support layer, wherein the trench separation elementpenetrates the support layer, the first insulation film and the SOIlayer, wherein the trench separation element separates the first regionand the second region, wherein the first circuit is disposed in the SOIlayer of the first region, and wherein the second circuit is disposed inthe support layer of the second region.
 2. The semiconductor deviceaccording to claim 1, wherein the SOI substrate further includes a stepbetween the first region and the second region, and wherein a height ofthe step corresponds to a total thickness of the SOI layer and the firstinsulation film.
 3. The semiconductor device according to claim 1,wherein the SOI substrate is a partial SOI substrate such that the SOIlayer and the first insulation film are partially disposed in the firstregion.
 4. The semiconductor device according to claim 3, wherein thefirst insulation film includes a plurality of insulation layers.
 5. Thesemiconductor device according to claim 1, wherein the first circuitincludes a signal processing circuit, and wherein the second circuitincludes a high power circuit, which handles electric power higher thanelectric power of the signal processing circuit.
 6. The semiconductordevice according to claim 5, wherein the high power circuit includes apower device.
 7. The semiconductor device according to claim 5, whereinthe high power circuit includes a plurality of power devices, whereinthe trench separation element includes a plurality of separationmembers, which is disposed in the second region, wherein each separationmember penetrates the support layer, wherein the second region isdivided into a plurality of second portions by the plurality ofseparation members, and wherein each power device is disposed in acorresponding second portion so that the high power circuit provides amulti-channel circuit.
 8. The semiconductor device according to claim 6,wherein the trench separation element includes a plurality of trenchesso that the trench separation element provides multi-trench separation.9. The semiconductor device according to claim 6, wherein the powerdevice is a vertical type power device for flowing current from a firstside to a second side of the support layer, wherein the first side ofthe support layer is opposite to the second side of the support layer,wherein the second region includes a main cell and a sensing cell,wherein the trench separation element is further disposed in the secondregion in such a manner that the trench separation element penetratesthe support layer, wherein the main cell is separated from the sensingcell with the trench separation element, and wherein the sensing cellflows current, which is in proportion to current flowing through themain cell.
 10. The semiconductor device according to claim 9, furthercomprising: a temperature sensor for detecting temperature of the powerdevice, wherein the temperature sensor is disposed in the support layerof the second region, and wherein the temperature sensor is separatedfrom the power device with the trench separation element.
 11. Thesemiconductor device according to claim 9, further comprising: atemperature sensor for detecting temperature of the power device,wherein the temperature sensor is disposed on the support layer in thesecond region through a second insulation film, and wherein thetemperature sensor is adjacent to the power device.
 12. Thesemiconductor device according to claim 5, further comprising: athreshold control electrode, wherein the first circuit includes a CMOStransistor, wherein the threshold control electrode is disposed on thesupport layer of the first region, wherein the threshold controlelectrode is electrically coupled with the support layer, and whereinthe threshold control electrode controls a threshold of the CMOStransistor.
 13. The semiconductor device according to claim 5, furthercomprising: a threshold control electrode, wherein the first circuitincludes a CMOS transistor, wherein the threshold control electrode isdisposed in the first region, wherein the threshold control electrodepenetrates the SOI layer and the first insulation film, and reaches thesupport layer, wherein the threshold control electrode is electricallycoupled with the support layer, wherein the threshold control electrodecontrols a threshold of the CMOS transistor, and wherein the CMOStransistor is isolated from the threshold control electrode with a thirdinsulation film, which is disposed in the SOI layer.
 14. Thesemiconductor device according to claim 13, wherein the support layer inthe first region further includes a P conductive type layer and a Nconductive type layer, wherein the P conductive type layer and the Nconductive type layer provide a PN junction, and wherein the thresholdcontrol electrode is electrically coupled with the P conductive typelayer in the support layer.
 15. The semiconductor device according toclaim 5, further comprising: a plurality of threshold controlelectrodes, wherein the trench separation element includes a pluralityof separation members, which is disposed in the first region, whereineach separation member penetrates the support layer, the firstinsulation film and the SOI layer, wherein the first region is dividedinto a plurality of first portions by the plurality of separationmembers, wherein the first circuit includes a plurality of CMOStransistors, each of which is disposed in the SOI layer of acorresponding first portion, wherein each threshold control electrode isdisposed on the support layer of a corresponding first portion, whereineach threshold control electrode is electrically coupled with thesupport layer, and wherein each threshold control electrode controls athreshold of a corresponding CMOS transistor.
 16. The semiconductordevice according to claim 1, further comprising: a thin film elementdisposed between the first region and the second region, wherein thethin film element is provided by the SOI layer and the first insulationfilm.
 17. The semiconductor device according to claim 16, wherein thethin film element includes a concavity and a diaphragm, wherein theconcavity is disposed in the SOI layer so that the SOI layer ispartially thinned, wherein the diaphragm is provided by a thinned SOIlayer and the first insulation film, and wherein the thin film elementis one of a sensor and a microphone.
 18. A method for manufacturing asemiconductor device comprising: bonding a SOI layer, a first insulationlayer and a support layer to provide a SOI substrate; forming a trenchin the SOI substrate to penetrate the SOI layer and the first insulationfilm and to reach the support layer; filling the trench with a secondinsulation film to provide a trench separation element, wherein thetrench separation element divides the SOI substrate into a first regionand a second region; forming a first circuit in the SOI layer of thefirst region; removing the SOI layer and the first insulation film inthe second region; and forming a second circuit in the support layer ofthe second region.
 19. A method for manufacturing a semiconductor devicecomprising: implanting an oxygen ion into a silicon substrate as a bulksubstrate; heating the silicon substrate to form an insulation film at apredetermined depth of the silicon substrate so that a SOI layer, thefirst insulation film and a silicon support layer provide a partial SOIsubstrate, wherein the partial SOI substrate includes a first region anda second region, and the first region includes the SOI layer, the firstinsulation film and the silicon support layer, and the second regionincludes only the silicon support layer; forming a trench in the partialSOI substrate to penetrate the SOI layer and the first insulation filmand to reach the silicon support layer, wherein the trench is disposedbetween the first region and the second region; filling the trench witha second insulation film to provide a trench separation element, whereinthe trench separation element divides the partial SOI substrate into thefirst region and the second region; forming a first circuit in the SOIlayer of the first region; and forming a second circuit in the supportlayer of the second region.
 20. The method according to claim 19,wherein the implanting the oxygen ion includes: implanting the oxygenion with a first implantation energy so that the oxygen ion is implantedat a first depth of the silicon substrate; and implanting the oxygen ionwith a second implantation energy so that the oxygen ion is implanted ata second depth of the silicon substrate, wherein the first implantationenergy is different from the second implantation energy so that thefirst depth is different from the second depth, and wherein the heatingthe silicon substrate provides to form a first insulation layer at thefirst depth of the silicon substrate and a second insulation layer atthe second depth of the silicon substrate so that the first insulationlayer and the second insulation layer provide the insulation film.